Micron Japan, Ltd. completed the acquisition of partial semiconductor testing service business from Tera Probe, Inc..
May 30, 2018
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Micron Japan, Ltd. agreed to acquire partial semiconductor testing service business from Tera Probe, Inc. (TSE:6627) for ¥3.8 billion on April 14, 2017. Semi-conductor testing service contract which Tera Probe, Inc. signed with Micron Memory Japan, Inc. and Micron Technology,Inc. will end on April 30, 2018. The transaction is expected to close on May 1, 2018. Nomura Securities Co., Ltd provided valuation report. TMI Associates acted as legal advisor to Tera Probe, Inc. on the business transfer.
Micron Japan, Ltd. completed the acquisition of partial semiconductor testing service business from Tera Probe, Inc. (TSE:6627) on May 1, 2018.
Tera Probe, Inc. is a Japan-based company mainly engaged in wafer testing, and final test consignment. The Company operates in two business segments. The Memory segment is mainly engaged in the contract wafer testing business of dynamic random access memory (DRAM) produced by semiconductor manufacturers and fabrication factories. The System Large-scale Integration (LSI) segment is principally involved in the contract wafer testing business of semiconductor products such as System on Chips (SoCs), image sensors and analogs produced by domestic and international semiconductor manufacturers and fabrication factories. This segment also operates contract final testing business.
TERA PROBE, INC. 
