LitePoint and Samsung Electronics jointly announced that they have closely collaborated to support the new security test cases defined in the FiRa 2.0 physical layer (PHY) Conformance Test Specifications. The new Secure Ranging test cases were implemented in LitePoint's automation test software, IQfact+ on the IQgig-UWB and IQgig-UWB+ platforms, and were verified using the latest Ultra-Wideband (UWB) chipset, the Exynos Connect U100, from Samsung. Taking advantage of its unique centimeter distance measurement accuracy, distance-bounding capability, and robust built-in cryptographic encryption, UWB has found widespread use cases in mission critical applications, such as asset tracking and digital key access, where precise location and security are essential.

The newly introduced PHY Security Level test cases expand upon the existing test cases specified in the FiRa 2. 0 Test specifications and enhance security elements related to the distance measurements. These new tests verify that the FiRa-certified UWB devices reliably detect and reject common malicious attacks, ensuring that FiRa certified devices achieve the level of security. The FiRa Consortium, an organization dedicated to advancing interoperability among UWB devices, unveiled the FiRa 2.0 Technical and Test Specifications in 2023.

FiRa 2.0 supports the development of new use cases, drives the widespread adoption of UWB-driven applications, and adds mitigation methods to malicious attacks. As the first test vendor to join FiRa, LitePoint continues to leverage its UWB PHY testing expertise to promote UWB device-level interoperability, making turnkey FiRa 2.0 PHY conformance verification test systems available toFiRa members. The LitePoint PHY test solution includes the IQgig-UWC+, which offers complete UWB physical-layer testing with all signal generation, analysis, and processing contained in a single instrument, combined with the IQfact+ test automation software.

IQfact+ application software provides complete automation for PHY conformance testing including tester control, Device Under Test (DUT) control, and data collection.